ROOM A211CN
SCANNING ELECTRON MICROSCOPE (SEM)
SERIAL BLOCK-FACE SCANNING ELECTRON MICROSCOPE (SBFSEM)
Microscope
Scanning Electron Microscope Zeiss Sigma VP with Gatan 3View2 chamber
Detection
BSED
VBSED
SE
InLens
STEM - TEM
Samples
For SEM fixed, critical point dried and sputter-coated with gold/carbon samples on special Zeiss stubs are accepted - please contact our core for details
For SBFSEM fixed, contrasted, embedded in resin. mounted on special Gatan's pins, properly trimmed and sputter-coated with thin layer of gold samples are accepted. Please remember that the size of the sample on pin can not be bigger than 700x700um. Please contact the core for a protocol